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Fault grading : ウィキペディア英語版 | Fault grading Fault grading is a procedure that rates testability by relating the number of fabrication defects that can in fact be detected with a test vector set under consideration to the total number of conceivable faults. It is used for refining both the test circuitry and the test patterns iteratively, until a satisfactory fault coverage is obtained. ==See also==
* Automatic test pattern generation * Design for Test
抄文引用元・出典: フリー百科事典『 ウィキペディア(Wikipedia)』 ■ウィキペディアで「Fault grading」の詳細全文を読む
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